Industry News
An instrument company launched a new 200V PXIe precision source meter S2012C
Views : 790
Author : JIUZHOU
Update time : 2022-11-11 10:30:40
An instrument company has launched a new PXIe precision source/measure unit S2012C. It has a minimum measurement resolution of 10fA/100nV and output voltages up to ±200V. Further expanding the application scenarios of PXIe source meters, engineers can use the S2012C SMU (Source Measure Unit) to measure low-current signals, while the high channel density, high-speed test throughput and flexibility of the PXIe SMU enable wafer-level parametric testing, Materials research and analysis of the properties of low current sensors and integrated circuits.
❶High precision
The S2012C has a resolution of up to 10fA/100nV, a voltage accuracy of 100μV, and a current accuracy of 10pA. It can be used to measure small leakage currents and other applications. The leakage current is usually at the pA level. The S2012C is equipped with 3 coaxial measurement terminals for small current tests below nA .
❷Adaptive PFC system
Users can use Adaptive PFC (Precise-Fast Control) system, users can adjust relevant parameters according to the load characteristics to obtain more accurate and fast output characteristics.
❸High-speed measurement
S2012C can support up to 1M sampling rate, NPLC and sampling rate can be set as needed to meet high-speed and high-precision measurement scenarios.
❹Build a multichannel parallel test system
The PXIe-based modular architecture facilitates the construction of compact parallel multichannel test systems that can scale to hundreds of channels for wafer-level reliability and parallel test needs.
❺DC I-V output capability
❻Pulse I-V output capability
❶High precision
The S2012C has a resolution of up to 10fA/100nV, a voltage accuracy of 100μV, and a current accuracy of 10pA. It can be used to measure small leakage currents and other applications. The leakage current is usually at the pA level. The S2012C is equipped with 3 coaxial measurement terminals for small current tests below nA .
❷Adaptive PFC system
Users can use Adaptive PFC (Precise-Fast Control) system, users can adjust relevant parameters according to the load characteristics to obtain more accurate and fast output characteristics.
❸High-speed measurement
S2012C can support up to 1M sampling rate, NPLC and sampling rate can be set as needed to meet high-speed and high-precision measurement scenarios.
❹Build a multichannel parallel test system
The PXIe-based modular architecture facilitates the construction of compact parallel multichannel test systems that can scale to hundreds of channels for wafer-level reliability and parallel test needs.
❺DC I-V output capability
❻Pulse I-V output capability
★SMU product line
Related News
Read More >>
AI Data Center Optical Evolution: Trends & Market
Sep .20.2026
With the rapid growth of artificial intelligence computing, data centers now need much more bandwidth. The physical limitations of traditional copper cable connections are becoming increasingly apparent as transmission speeds rise.
The Global OCS Market Will Exceed $8 Billion by 2030
Sep .09.2026
The latest industry forecasts indicate that by 2030, the total size of the global optical path switch market is expected to exceed $8 billion, with a compound annual growth rate (CAGR) of over 30% between 2026 and 2030.
400G Single-Lane: Next Inflection for AI Datacenters
Aug .27.2026
400G per lane is the next inflection for AI data centers, boosting bandwidth and scaling, but requires advances in materials, packaging, and cooling.
AI-driven 800G Ramp-up Amplifies Quality Risks
Aug .14.2026
Faced with a surge in orders, leading global manufacturers are increasing production line speeds and shortening delivery cycles. However, the real challenge of this growth goes beyond “can we deliver orders on time?”