Industry News
An instrument company launched a new 200V PXIe precision source meter S2012C
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Author : JIUZHOU
Update time : 2022-11-11 10:30:40
An instrument company has launched a new PXIe precision source/measure unit S2012C. It has a minimum measurement resolution of 10fA/100nV and output voltages up to ±200V. Further expanding the application scenarios of PXIe source meters, engineers can use the S2012C SMU (Source Measure Unit) to measure low-current signals, while the high channel density, high-speed test throughput and flexibility of the PXIe SMU enable wafer-level parametric testing, Materials research and analysis of the properties of low current sensors and integrated circuits.
❶High precision
The S2012C has a resolution of up to 10fA/100nV, a voltage accuracy of 100μV, and a current accuracy of 10pA. It can be used to measure small leakage currents and other applications. The leakage current is usually at the pA level. The S2012C is equipped with 3 coaxial measurement terminals for small current tests below nA .
❷Adaptive PFC system
Users can use Adaptive PFC (Precise-Fast Control) system, users can adjust relevant parameters according to the load characteristics to obtain more accurate and fast output characteristics.
❸High-speed measurement
S2012C can support up to 1M sampling rate, NPLC and sampling rate can be set as needed to meet high-speed and high-precision measurement scenarios.
❹Build a multichannel parallel test system
The PXIe-based modular architecture facilitates the construction of compact parallel multichannel test systems that can scale to hundreds of channels for wafer-level reliability and parallel test needs.
❺DC I-V output capability
❻Pulse I-V output capability
❶High precision
The S2012C has a resolution of up to 10fA/100nV, a voltage accuracy of 100μV, and a current accuracy of 10pA. It can be used to measure small leakage currents and other applications. The leakage current is usually at the pA level. The S2012C is equipped with 3 coaxial measurement terminals for small current tests below nA .
❷Adaptive PFC system
Users can use Adaptive PFC (Precise-Fast Control) system, users can adjust relevant parameters according to the load characteristics to obtain more accurate and fast output characteristics.
❸High-speed measurement
S2012C can support up to 1M sampling rate, NPLC and sampling rate can be set as needed to meet high-speed and high-precision measurement scenarios.
❹Build a multichannel parallel test system
The PXIe-based modular architecture facilitates the construction of compact parallel multichannel test systems that can scale to hundreds of channels for wafer-level reliability and parallel test needs.
❺DC I-V output capability
❻Pulse I-V output capability
★SMU product line
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